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Integrated Data Acquisition and Instrument Control for Local and Remote Operation of Electron Microscopes Equipped With Imaging Detectors and Spectrometers

Published online by Cambridge University Press:  02 July 2020

W. J. de Ruijter  and
J.K. Weiss
W. J. de Ruijter
Affiliation:
EMiSPEC Systems, Inc., 2409 S. Rural Rd., Suite D, Tempe, AZ, 85282
J.K. Weiss
Affiliation:
EMiSPEC Systems, Inc., 2409 S. Rural Rd., Suite D, Tempe, AZ, 85282
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Extract

The continuing remarkable progress of computer technology is dramatically changing how electron optical instrumentation is being used. Instead of concentrating on taking just one spectrum or one image at a time, it now has become possible to design complete experiments aimed at solving the problems at hand more rapidly and more directly.

We have designed a PC-based acquisition system that aims to innovate and simplify both TEM and STEM operation. The first advance this system represents is integrated data acquisition from all detectors commonly found on electron microscopes: TV and slow-scan CCD cameras, different flavors of STEM detectors, and EDX, CL, Auger and EELS spectrometers. The new system allows experiments combining microscope control with the acquisition capabilities of all these detectors. The second advance is the implementation of “live” processing. Most common processing tasks can be executed on-the-fly, even at video-rate acquisition speeds.

Type
Advances in Remote Microscopy, Instrument Automation and Data Storage
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 48 - 49
Copyright
Copyright © Microscopy Society of America

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References

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