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Industrial Applications of Near-Infrared Chemical Imaging Microscopy

Published online by Cambridge University Press:  02 July 2020

EN Lewis ,
LH Kidder  and
KS Haber
EN Lewis
Affiliation:
Spectral Dimensions, Inc., 3416 Olandwood Court, Suite 210, Olney, MD, 20832, USA
LH Kidder
Affiliation:
Spectral Dimensions, Inc., 3416 Olandwood Court, Suite 210, Olney, MD, 20832, USA
KS Haber
Affiliation:
Spectral Dimensions, Inc., 3416 Olandwood Court, Suite 210, Olney, MD, 20832, USA
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Abstract

Single point near-infrared (NIR) spectroscopy is used extensively for characterizing raw materials and finished products in a wide variety of industries: polymers, paper, film, pharmaceuticals, paintings and coatings, food and beverages, agricultural products. As advanced industrial materials become more complex, their functionality is often determined by the spatial distribution of their discrete sample constituents. However, conventional single point NIR spectroscopy cannot adequately probe the interrelationship between the spatial distribution of sample components with the physical properties of the sample. to fully characterize these samples, it is necessary to probe simultaneously spatial and chemical heterogeneity and correlate these properties with sample characteristics.

Recently, we have developed a novel NIR imaging spectrometer that can deliver spatially resolved chemical information very rapidly. in contrast to conventional, single point NIR spectrometers, the imaging system uses an infrared focal-plane array (FPA) to collect up to 76,800 complete spectra, one for each pixel on the array, in approximately one minute.

Type
Industrial Applications of Optical Spectroscopy in Microanalysis (Organized by F. Adar and A. Whitley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 162 - 163
Copyright
Copyright © Microscopy Society of America 2001

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