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In Situ Electrical Probing by TEM-STM: Instrumentation and Applications for Nanocharacterization

Published online by Cambridge University Press:  01 August 2004

Christële M Grimaud  and
Oleg R Lourie
Christële M Grimaud
Affiliation:
Nanofactory Instruments AB, Göteborg, Sweden
Oleg R Lourie
Affiliation:
Gatan, Pleasanton, California
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1112 - 1113
Copyright
© 2004 Microscopy Society of America

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