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Image-Spectroscopy: Applying EELS Analysis Techniques to EFTEM Series
Published online by Cambridge University Press: 02 July 2020
Extract
The energy-loss spectrum of transmitted electrons contains a wealth of information regarding the physical, chemical and electronic properties of the medium under analysis. It provides a powerful means for materials characterisation in the TEM by use of electron energy-loss spectroscopy (EELS) or its spatially parallel counterpart, energy-selective imaging (ESI). Essentially, both analyses probe the same core-loss information, recording transmitted intensity / as a function of energy-loss E and spatial position x, y, to yield a three-dimensional data set I(E, x, y). Acquisition of an extended series of energy-selected images across the energy-loss range of interest has been shown to provide useful spectral as well as spatial information, with the resolution of extracted ‘image-spectra’ being determined by the energy interval between acquisitions and the width of the energy-selecting slit, as illustrated in Figure la . This mode of analysis, termed ‘image-spectroscopy’ is directly analogous to spectrum-imaging in the STEM, and offers many advantages over conventional two- or three-window elemental mapping techniques .
- Type
- Electron Energy-Loss Spectroscopy (EELS) and Imaging
- Information
- Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 150 - 151
- Copyright
- Copyright © Microscopy Society of America