Hostname: page-component-586b7cd67f-t7fkt Total loading time: 0 Render date: 2024-11-28T17:44:37.869Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Resolution Electron Microscopy, 4th ed., John C.H. Spence, Oxford University Press, Oxford, UK; 2013, Hardcover, 432 pp., ISBN: 978-0-19-966863-2; 3rd ed., John C.H. Spence, Oxford University Press, 2009, Paperback, 401 pp., ISBN: 978-0-19-955275-7

Review products

High-Resolution Electron Microscopy, 4th ed., John C.H. Spence, Oxford University Press, Oxford, UK; 2013, Hardcover, 432 pp., ISBN: 978-0-19-966863-2; 3rd ed., John C.H. Spence, Oxford University Press, 2009, Paperback, 401 pp., ISBN: 978-0-19-955275-7

Published online by Cambridge University Press:  26 October 2015

Jian-Min Zuo
Jian-Min Zuo*
Affiliation:
Department of Materials Science and EngineeringUniversity of IllinoisUrbana-Champaign, IL, USA 61801
Get access

Abstract

An abstract is not available for this content so a preview has been provided. Please use the Get access link above for information on how to access this content.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Book Reviews
Information
Microscopy and Microanalysis , Volume 21 , Issue 6 , December 2015 , pp. 1657 - 1658
Copyright
© Microscopy Society of America 2015 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)