Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-02T22:51:20.932Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

Published online by Cambridge University Press:  05 August 2007

K van Benthem ,
GS Painter ,
PF Becher ,
CI Contescu ,
NC Gallego  and
S Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
GS Painter
Affiliation:
Oak Ridge National Laboratory
PF Becher
Affiliation:
Oak Ridge National Laboratory
CI Contescu
Affiliation:
Oak Ridge National Laboratory
NC Gallego
Affiliation:
Oak Ridge National Laboratory
S Pennycook
Affiliation:
Oak Ridge National Laboratory
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 870 - 871
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)