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High Resolution HAADF-STEM Imaging Analysis of N related defects in GaNAs Quantum Wells

Published online by Cambridge University Press:  03 August 2008

M Herrera ,
Q Ramasse ,
ND Browning ,
J Pizarro ,
PL Galindo ,
D Gonzalez ,
R Garcia ,
MW Du ,
SB Zhang  and
M Hopkinson
M Herrera
Affiliation:
University of California, Davis
Q Ramasse
Affiliation:
Lawrence Berkeley National Laboratory
ND Browning
Affiliation:
Lawrence Livermore National Laboratory
J Pizarro
Affiliation:
University of Cadiz, Spain
PL Galindo
Affiliation:
University of Cadiz, Spain
D Gonzalez
Affiliation:
University of Cadiz, Spain
R Garcia
Affiliation:
University of Cadiz, Spain
MW Du
Affiliation:
Oak Ridge National Laboratory
SB Zhang
Affiliation:
Rensselaer Polytechnic Institute
M Hopkinson
Affiliation:
University of Sheffield, United Kingdom"
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 318 - 319
Copyright
© 2008 Microscopy Society of America

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