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High Angle Annular Dark Field (HAADF) STEM Tomography of Nanostructured Catalysts

Published online by Cambridge University Press:  02 July 2020

M. Weyland ,
P.A. Midgley  and
J.M. Thomas
M. Weyland
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
P.A. Midgley
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, Pembroke Street, Cambridge, CB2 3QZ, UK
J.M. Thomas
Affiliation:
Davy Faraday Research Laboratory, Royal Institution of Great Britain, 21 Albermarle Street, London, W1X 4BS
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Abstract

Progress in the design of catalysts based on nanoparticles supported within a mesoporous silica framework requires structural analysis at high spatial resolution. While bulk analysis by X-ray diffraction and EXAFS can give the structure of active sites they are unable to determine their relative positions and local physical structure. Some success has been achieved using a combination of STEM ADF imaging and EDX mapping to elucidate such structures but these results are limited to giving 2D projections of 3D arrangements. The need exists therefore to analyse specimens in full 3D. A suitable approach is electron tomography where the 3D structure is reconstructed from a tilt series of 2D projections. in conventional electron tomography a tilt series is acquired using bright field (BF) TEM. However the large beam current means such an approach generally cannot be used on specimens based on a mesoporous silica framework as beam damage can develop rapidly.

Type
Characterization of Catalysts (Organized by S. Bradley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1104 - 1105
Copyright
Copyright © Microscopy Society of America 2001

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References

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