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Grain Boundary Characterization in Yttria-Stabilized Zirconia by TEM Spectrum Lines

Published online by Cambridge University Press:  02 July 2020

N. D. Evans ,
P. H. Imamura  and
M. L. Mecartneyf
N. D. Evans
Affiliation:
Oak Ridge Institute for Science and Education, Oak Ridge, TN37831-0117 Metals and Ceramics Division, Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN37831-6376
P. H. Imamura
Affiliation:
Dept. Chemical and Biochemical Engineering and Materials Science, University of California, Irvine, CA92697
M. L. Mecartneyf
Affiliation:
Dept. Chemical and Biochemical Engineering and Materials Science, University of California, Irvine, CA92697
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Extract

The superplasticity exhibited by some fine-grained ceramics, notably 3-mol% yttria-stabilized tetragonal zirconia polycrystals (3Y-TZP), offers interesting possibilities to lower manufacturing costs by near net shape forming. Both glassy and crystalline materials have been added to pure 3 Y-TZP to limit grain growth and promote grain boundary sliding during sintering and isostatic pressing. EDS spectrum lines have been used to characterize the distribution and extent of additive phases, but were not able to map some light-element components of additives (e.g., O and B in borosilicate glass). Additionally, quantification of the Si Kα peak was compromised by overlap with the Y L and Z L peaks. To both improve light element sensitivity and investigate potential changes in oxygen bonding at the grain boundaries, undoped 3 Y-TZP and 3 Y-TZP powders processed with 1 wt% barium silicate have been examined with TEM spectrum lines. Additionally, some elemental mapping has been performed. TEM specimens were examined in a 300 kV LaB6 Philips CM30T equipped with a Gatan imaging filter (GIF) at the ORNL SHaRE User Facility.

Type
Electron Energy-Loss Spectroscopy (EELS) and Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 220 - 221
Copyright
Copyright © Microscopy Society of America

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References

1.Sharif, A. A. et. al, Mat. Science Forum 304-306 (1999) 443.CrossRefGoogle Scholar
2.Evans, N. D. et. al, Microscopy and Microanalysis 4(suppl. 2) (1998) 584.CrossRefGoogle Scholar
3.Bentley, J. and Anderson, I. M., Microscopy and Microanalysis 1996, San Francisco: San Francisco Press (1996) 532.Google Scholar
4.Ikuhara, Y., Thavorniti, P., and Sakuma, T., Acta Mater., 45 (1997) 5275.CrossRefGoogle Scholar
5. Research at the SHaRE User Facility is sponsored by the Division of Materials Sciences and Engineering, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., and through the SHaRE Program under contract DE-AC05-76OR00033 with Oak Ridge Associated Universities. Discussions with Dr. Jim Bentley are gratefully acknowledged.Google Scholar