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Fluctuation Microscopy with Electrons or X-Rays: Insight into Medium-Range Order

Published online by Cambridge University Press:  01 August 2004

J. M. Gibson ,
M.M.J. Treacy ,
L. Fan ,
I. McNulty  and
D. Paterson
J. M. Gibson
Affiliation:
Argonne National Laboratory, Argonne, Illinois
M.M.J. Treacy
Affiliation:
Arizona State University
L. Fan
Affiliation:
Argonne National Laboratory, Argonne, Illinois
I. McNulty
Affiliation:
Argonne National Laboratory, Argonne, Illinois
D. Paterson
Affiliation:
Argonne National Laboratory, Argonne, Illinois
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 806 - 807
Copyright
© 2004 Microscopy Society of America

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