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First Results from the Aberration-Corrected JEOL 2200FS-AC STEM/TEM

Published online by Cambridge University Press:  01 August 2004

Lawrence F Allard ,
Douglas A Blom ,
Michael A O'Keefe ,
Chris J Kiely ,
D. Ackland ,
M. Watanabe ,
M. Kawasaki ,
T. Kaneyama  and
H. Sawada
Lawrence F Allard
Affiliation:
Oak Ridge National Laboratory, Oak Ridge Tennessee
Douglas A Blom
Affiliation:
Oak Ridge National Laboratory, Oak Ridge Tennessee
Michael A O'Keefe
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California
Chris J Kiely
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
D. Ackland
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
M. Watanabe
Affiliation:
Lehigh University, Bettlehem, Pennsylvania
M. Kawasaki
Affiliation:
JEOL USA, Peabody, Massachussetts
T. Kaneyama
Affiliation:
JEOL, Tokyo, Japan
H. Sawada
Affiliation:
JEOL, Tokyo, Japan
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 110 - 111
Copyright
© 2004 Microscopy Society of America

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