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Extracting Grain Orientations from EBSD Patterns of Polycrystalline Materials Using Convolutional Neural Networks

Published online by Cambridge University Press:  18 October 2018

Dipendra Jha ,
Saransh Singh ,
Reda Al-Bahrani ,
Wei-keng Liao ,
Alok Choudhary ,
Marc De Graef  and
Ankit Agrawal
Dipendra Jha
Affiliation:
Department of Electrical Engineering and Computer Science, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA
Saransh Singh
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
Reda Al-Bahrani
Affiliation:
Department of Electrical Engineering and Computer Science, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA
Wei-keng Liao
Affiliation:
Department of Electrical Engineering and Computer Science, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA
Alok Choudhary
Affiliation:
Department of Electrical Engineering and Computer Science, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA
Marc De Graef
Affiliation:
Department of Materials Science and Engineering, Carnegie Mellon University, 5000 Forbes Avenue, Pittsburgh, PA 15213, USA
Ankit Agrawal*
Affiliation:
Department of Electrical Engineering and Computer Science, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208, USA
*
*Author for correspondence: Ankit Agrawal, E-mail: [email protected]
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Abstract

We present a deep learning approach to the indexing of electron backscatter diffraction (EBSD) patterns. We design and implement a deep convolutional neural network architecture to predict crystal orientation from the EBSD patterns. We design a differentiable approximation to the disorientation function between the predicted crystal orientation and the ground truth; the deep learning model optimizes for the mean disorientation error between the predicted crystal orientation and the ground truth using stochastic gradient descent. The deep learning model is trained using 374,852 EBSD patterns of polycrystalline nickel from simulation and evaluated using 1,000 experimental EBSD patterns of polycrystalline nickel. The deep learning model results in a mean disorientation error of 0.548° compared to 0.652° using dictionary based indexing.

Keywords

electron backscatter diffractionEBSDdeep learningconvolutional neural networks
Type
Software and Instrumentation
Information
Microscopy and Microanalysis , Volume 24 , Issue 5 , October 2018 , pp. 497 - 502
Copyright
© Microscopy Society of America 2018 

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