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Extension of HRTEM Resolution: Solving Structures of Grain Boundary and Interface Using Gerchberg-Saxton Algorithm and Blind Deconvolution

Published online by Cambridge University Press:  02 July 2020

F.-R. Chen ,
H. Ichinose ,
J. J. Kai  and
L. Chang
F.-R. Chen
Affiliation:
Dept. of Engineering and System Science, National Tsing Hua University, Taiwan
H. Ichinose
Affiliation:
Dept. of Materials Science and Engineering, Tokyo University, Japan
J. J. Kai
Affiliation:
Dept. of Engineering and System Science, National Tsing Hua University, Taiwan
L. Chang
Affiliation:
Dept. of Materials and Engineering, National Chiao-Tong University, Taiwan
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Abstract

Oxides, nitrides, carbides and silicides contain more than one type of atoms that gives one extra degree of freedom in the grain boundary and interfacial structure. This degree of freedom is the choice of the boundary plane containing different type of atoms which results of several structural multiplicities in the boundary. Coexistence of the structural multiplicities (or boundary domains) in the interface and grain boundary were reported [1, 2]. The structural information in high frequency domain is usually blurred and lost in the lens system of a high resolution transmission electron microscopes (HRTEM) such that the HRTEM image may not truly represent the real structure. Conventionally, the structures of grain boundary and interface were solved using forward method. The forward method involves matching the simulated images from guessed possible models with the through focal series experimental images. Recently, rereconstruction methods such as focal variation holography [3, 4], tiltbeam holography [5] and Gerchberg-Saxton algorithm [6] provide a backward (direct) way to recover the structural information lost in a modern microscope.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 242 - 243
Copyright
Copyright © Microscopy Society of America 2001

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References

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