Hostname: page-component-586b7cd67f-gb8f7 Total loading time: 0 Render date: 2024-11-25T15:23:03.670Z Has data issue: false hasContentIssue false
  • English
  • Français

Exploring new frontiers with the Nion aberration-corrected STEM

Published online by Cambridge University Press:  23 November 2012

N.J. Bacon ,
G.J. Corbin ,
N. Dellby ,
P. Hrncirik ,
N. Kurz ,
T.C. Lovejoy ,
M.F. Murfitt ,
G.S. Skone ,
Z.S. Szilagyi  and
O.L. Krivanek
N.J. Bacon
Affiliation:
Nion Co., Kirkland, WA
G.J. Corbin
Affiliation:
Nion Co., Kirkland, WA
N. Dellby
Affiliation:
Nion Co., Kirkland, WA
P. Hrncirik
Affiliation:
Nion Co., Kirkland, WA
N. Kurz
Affiliation:
Nion Co., Kirkland, WA
T.C. Lovejoy
Affiliation:
Nion Co., Kirkland, WA
M.F. Murfitt
Affiliation:
Nion Co., Kirkland, WA
G.S. Skone
Affiliation:
Nion Co., Kirkland, WA
Z.S. Szilagyi
Affiliation:
Nion Co., Kirkland, WA
O.L. Krivanek
Affiliation:
Nion Co., Kirkland, WA
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1278 - 1279
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)