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Enhanced Surface and In-Depth Characterization of Organic and Inorganic Materials Using XPS and Soft Depth Profiling with Argon Cluster Ion Beams

Published online by Cambridge University Press:  23 November 2012

B.R. Strohmeier ,
R.G. White ,
T.S. Nunney ,
P. Mack  and
A.E. Wright
B.R. Strohmeier
Affiliation:
Thermo Fisher Scientific, Pittsburgh, PA
R.G. White
Affiliation:
Thermo Fisher Scientific, East Grinstead, West Sussex, United Kingdom
T.S. Nunney
Affiliation:
Thermo Fisher Scientific, East Grinstead, West Sussex, United Kingdom
P. Mack
Affiliation:
Thermo Fisher Scientific, East Grinstead, West Sussex, United Kingdom
A.E. Wright
Affiliation:
Thermo Fisher Scientific, East Grinstead, West Sussex, United Kingdom
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 918 - 919
Copyright
Copyright © Microscopy Society of America 2012

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