Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-24T19:33:03.803Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron tomography at 2.4 Å resolution

Published online by Cambridge University Press:  23 November 2012

M.C. Scott ,
C.C. Chen ,
M. Mechlenburg ,
C. Zhu ,
R. Xu ,
C. Regan ,
J. Miao ,
P. Ercius  and
U. Dahmen
M.C. Scott
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C.C. Chen
Affiliation:
University of California, Los Angeles, Los Angeles, CA
M. Mechlenburg
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C. Zhu
Affiliation:
University of California, Los Angeles, Los Angeles, CA
R. Xu
Affiliation:
University of California, Los Angeles, Los Angeles, CA
C. Regan
Affiliation:
University of California, Los Angeles, Los Angeles, CA
J. Miao
Affiliation:
University of California, Los Angeles, Los Angeles, CA
P. Ercius
Affiliation:
National Center for Electron Microscopy, Berkeley, CA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Berkeley, CA
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 522 - 523
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)