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Electron Scattering with an Atomic Sized Probe

Published online by Cambridge University Press:  02 July 2020

J. Silcox
J. Silcox*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, 14853
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Extract

It is the presence of local variations in atomic and electronic structure that often gives rise to intriguing properties of materials. Control of material properties then rests on detection of the local variations in the materials, determination of the origin of those variations and then understanding how such variations can be controlled to achieve a desired functionality. Recent examples using STEM with an atomic sized probe (∼2.2 Å) include studies of the bonding at grain boundaries in nickel rich Ni3Al doped with boron. EELS measurements revealed changes in the d-hole density-of-states that were used to estimate changes in the electronic contribution to the grain boundary energy. These changes in grain boundary strength correlated with a change in fracture from an intra- to an inter-granular mode. In another example, the observation of metal induced gap states at Cu/MgO interfaces provided evidence that the dipole moment across that interface was relatively low.

Type
The Theory and Practice of Scanning Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 102 - 103
Copyright
Copyright © Microscopy Society of America

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References

1 Muller, D. A., et al., Phys. Rev. Lett. 75 (1995) 4744CrossRefGoogle Scholar

2 Muller, D. A., et al., Phys. Rev. Lett. 80 (1998) 4741CrossRefGoogle Scholar

3 Muller, D. A., et al., Nature, 399 (1999) 758CrossRefGoogle Scholar

4 Muller, D.A. and Silcox, J., Phil. Mag. 71 (1995) 1375CrossRefGoogle Scholar

5 Hillyard, S. and Silcox, J., Ultramicroscopy 52 (1993) 325CrossRefGoogle Scholar

6 Support from the Department of Energy and the National Science Foundation is gratefully acknowledged.Google Scholar