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Electron Energy Loss Spectroscopy (EELS) At the Magic Angle

Published online by Cambridge University Press:  02 July 2020

R. Brydson ,
H. Daniels ,
A. Brown ,
A. Scott ,
A. Nichells  and
B. Rand
R. Brydson
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
H. Daniels
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
A. Brown
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
A. Scott
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
A. Nichells
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
B. Rand
Affiliation:
LEMAS Centre, Department of Materials, University of Leeds, Leeds, LS2 9JT, U.K.
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Abstract

Electron loss near edge structure (ELNES) reflects transitions of inner shell electrons to site- and symmetry-projected unoccupied electronic states, which in a solid lie above the Fermi level and may be calculated using advanced electronic structure calculations. The direction of momentum transfer, q, imparted during the inelastic scattering process is dependent on the angle over which the scattered electrons are collected. It is usual to resolve the momentum transfer, into components parallel and perpendicular to the incident beam direction (q∥and q⊥). in a specimen region which is crystallographically anisotropic, the exact direction of the momentum transfer and hence energy states available to the excited electron will depend on the specimen orientation with respect to the incident electron beam. Practically, this can present problems where quantitative comparisons and/or modelling of electronic structure between different specimen regions at different orientations, or within a polycrystalline material, or even between different samples are required.

Type
EELS Microanalysis at High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1178 - 1179
Copyright
Copyright © Microscopy Society of America 2001

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References

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