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Electron Energy Loss Spectroscopy Characterisation of the Sp2 Bonding Fraction Within Carbon Thin Films.

Published online by Cambridge University Press:  02 July 2020

A.J. Papworth ,
C.J. Kiely ,
S.R.P. Silva  and
G.A.J. Amaratunga
A.J. Papworth
Affiliation:
Materials Research Centre, Lehigh University, Bethlehem, Pennsylvania18015-3195, USA.
C.J. Kiely
Affiliation:
Department of Engineering, Materials Science and Engineering, The University of Liverpool, Liverpool, L69 3BX, U.K.
S.R.P. Silva
Affiliation:
Department of Electrical Engineering, The University of Surrey, Guildford, Surrey, UK.
G.A.J. Amaratunga
Affiliation:
Department of Engineering, The University of Cambridge, Cambridge, UK.
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Extract

Electron energy loss spectroscopy is the only direct technique that can semi-quantitatively determine the nature of the bonding in carbon thin films. To quantify the sp2/sp3 bonding fraction, the spectrum taken from the film must be compared to that of a suitable known standard. The bonding fraction can be analysed by studying the K ionisation edge in the electron energy loss spectrum. A method for quantifying the sp2 bonding fraction in an amorphous carbon film has been described by Berger et al (1988), where the area of peak of the film is compared with that of graphite. The principle of quantifying the edge structure is to obtain a ratio of the two peak areas using the following formula, (1), where fπis the ratio between the two π* peaks, Iπ. is the integral of the transition, and ΔE is the integrated counts for the normalising energy window. The superscripts s and u denote the standard and unknown spectra respectively.

Type
Compositional Imaging and Spectroscopy
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 632 - 633
Copyright
Copyright © Microscopy Society of America

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References

1.)Berger, S.D. and McKenzie, D.R., Phil. Mag. Lett., 1988, Vol. 57 No. 6, 285–290.CrossRefGoogle Scholar
2.)Silva, S.R.P., Robertson, J., Rushli, , Amaratunga, G.A.J. and Schwan, J., Phil. Mag. B, 74, (4), 1996, 369–386.CrossRefGoogle Scholar
3.)Hitchcock, A.P., Newbury, D.C., Ishii, I., Horsley, J.A., Redwing, R.D., Johnson, A.L. and Sette, F., J. Chem. Phys. 85 (9) 1986, 4849–4862.CrossRefGoogle Scholar
4.)Sette, F., Stöhr, J. and Hitchcock, A.P., J. Chem. Phys. 81 (11) 1984, 4906–4914.CrossRefGoogle Scholar
5.)McLaren, R., Clark, S.A.C., Ishii, I., and Hitchcock, A.P., Phys. Rev. A Vol. 36, No. 4, 1987, 1683–1700.CrossRefGoogle Scholar
6.)Treacy, M.M.J. and Gibson, J.M., Inst. Phys. Conf. Ser. No 153 1997, 433–436.Google Scholar
7.)This work was supported by UK Engineering and Physical Sciences Research Council under research grant GRL12783Google Scholar