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Electron Diffraction Based Analysis of Phase Fractions and Texture in Nanocrystalline Thin Films, Part III: Application Examples

Published online by Cambridge University Press:  21 March 2012

J.L. Lábár ,
M. Adamik ,
B.P. Barna ,
Zs. Czigány ,
Zs. Fogarassy ,
Z.E. Horváth ,
O. Geszti ,
F. Misják ,
J. Morgiel  and
G. Radnóczi
...Show all authors
J.L. Lábár*
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
M. Adamik
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
B.P. Barna
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
Zs. Czigány
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
Zs. Fogarassy
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
Z.E. Horváth
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
O. Geszti
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
F. Misják
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
J. Morgiel
Affiliation:
Institute of Metallurgy and Materials Science, Polish Academy of Sciences, 25 Reymonta st., 30-059 Kraków, Poland
G. Radnóczi
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
G. Sáfrán
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
L. Székely
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary
T. Szüts
Affiliation:
Research Institute for Technical Physics and Materials Science, H-1121 Budapest, Konkoly-Thege M. út 29-33, Hungary Program in Biophysics, Harvard University, Cambridge, MA, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

In this series of articles, a method is presented that performs (semi)quantitative phase analysis for nanocrystalline transmission electron microscope samples from selected area electron diffraction (SAED) patterns. Volume fractions and degree of fiber texture are determined for the nanocrystalline components. The effect of the amorphous component is minimized by empirical background interpolation. First, the two-dimensional SAED pattern is converted into a one-dimensional distribution similar to X-ray diffraction. Volume fractions of the nanocrystalline components are determined by fitting the spectral components, calculated for the previously identified phases with a priori known structures. These Markers are calculated not only for kinematic conditions, but the Blackwell correction is also applied to take into account dynamic effects for medium thicknesses. Peak shapes and experimental parameters (camera length, etc.) are refined during the fitting iterations. Parameter space is explored with the help of the Downhill-SIMPLEX. The method is implemented in a computer program that runs under the Windows operating system. Part I presented the principles, while part II elaborated current implementation. The present part III demonstrates the usage and efficiency of the computer program by numerous examples. The suggested experimental protocol should be of benefit in experiments aimed at phase analysis using electron diffraction methods.

Keywords

electron diffractionSAEDring patternsnanocrystalsthin filmsphase fractionstexturequantitative analysisTEMcomputer program
Type
Techniques and Software Development
Information
Microscopy and Microanalysis , Volume 18 , Issue 2 , April 2012 , pp. 406 - 420
Copyright
Copyright © Microscopy Society of America 2012

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References

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