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Electron Backscattered Diffraction and Transmission Electron Microscopy Analysis of Ribbon Silicon

Published online by Cambridge University Press:  23 November 2012

S. Rouvimov ,
E. Tsidilkovski  and
J.J. Donovan
S. Rouvimov
Affiliation:
Physics, Portland State University, Portland, OR
E. Tsidilkovski
Affiliation:
Evergreen Solar, Marlboro, MA
J.J. Donovan
Affiliation:
University of Oregon, Eugene, OR
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1442 - 1443
Copyright
Copyright © Microscopy Society of America 2012

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