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Electron Backscatter Diffraction Characterization of Nanostructured Thermoelectric Materials

Published online by Cambridge University Press:  23 November 2012

M. Nowell ,
J. Beck ,
M. Alvarado  and
D. Nemir
M. Nowell
Affiliation:
EDAX-TSL, Draper, UT
J. Beck
Affiliation:
TXL Group Inc., El Paso, TX
M. Alvarado
Affiliation:
TXL Group Inc., El Paso, TX
D. Nemir
Affiliation:
TXL Group Inc., El Paso, TX
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1450 - 1451
Copyright
Copyright © Microscopy Society of America 2012

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