Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T05:41:03.558Z Has data issue: false hasContentIssue false
  • English
  • Français

Effect of Shape on Solid-Liquid Phase Changes of Xe Precipitates in An Al Matrix

Published online by Cambridge University Press:  02 July 2020

K. Mitsuishi ,
C.W. Allen ,
R. C. Birtcher  and
U. Dahmen
K. Mitsuishi
Affiliation:
On leave from National Research Institute for Metals, Tsukuba, Ibaraki, Japan
C.W. Allen
Affiliation:
Material Science Division, Argonne National Laboratory, Argonne, ILUSA
R. C. Birtcher
Affiliation:
Material Science Division, Argonne National Laboratory, Argonne, ILUSA
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, University of California, Berkeley, CAUSA
Get access

Abstract

It is well known that rare-gas Xe atoms embedded in a crystalline Al matrix form precipitates having cuboctahedral shapes bounded by ﹛100﹜ and ﹛111﹜ surfaces1. Below a certain critical size, Xe precipitates are observed to be solid, even at room temperature. This is a result of the Laplace pressure, which is inversely proportional to the radius of the precipitate. Donnelly et al. reported that the critical size of Xe solidification was expected at 4nm in radius at room temperature.

Using high-resolution transmission electron microscopy, it is possible to observe these particles directly. It has been demonstrated that under off-Bragg conditions, the Al lattice fringes are minimized whereas the Xe lattice fringes are maximized. From such observations, it was confirmed experimentally that the average critical size of Xe precipitates is around 4 to 5nm in radius. However, much larger Xe precipitates are sometime observed to remain solid.

Type
Metals and Alloys
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1258 - 1259
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

References:

1.Templier, C. et al., Phys. Stat. Sol.(a) 92, 516 (1985).CrossRefGoogle Scholar
2.Donnelly, S. E. and Rossouw, C. J., Phys. Rev. B 13, 485 (1986).Google Scholar
3.Mitsuishi, K., Song, M., Furuya, K., Birtcher, R. C., Allen, C. W., Donnelly, S. E., Nucl. Instr. and Methods in Phys. Res. B 148, 184 (1999).CrossRefGoogle Scholar
4. This work was supported by Science and Technology Agency of Japan, and by the Director, Office of Basic Energy Sciences, Materials Science and Engineering Division, US Department of Energy, under contracts DE-AC3-76SF00098 and W-31-109-Eng-38.Google Scholar