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Direct Mapping of Octahedral Tilts in Perovskite Oxide Materials Using Bright Field Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  23 November 2012

Y. Kim ,
S.J. Pennycook ,
S.V. Kalinin ,
A.Y. Borisevich ,
P. Yu ,
R. Ramesh  and
Y. Chu
Y. Kim
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.V. Kalinin
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
A.Y. Borisevich
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
P. Yu
Affiliation:
University of California-Berkely, Berkely, CA
R. Ramesh
Affiliation:
University of California-Berkely, Berkely, CA
Y. Chu
Affiliation:
National Chiao Tung University, Hsinchu, Taiwan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 420 - 421
Copyright
Copyright © Microscopy Society of America 2012

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