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Diffraction Measurement Of Local Lattice Parameters Using a Nanometer Sized Probe in STEM for Interface Studies

Published online by Cambridge University Press:  02 July 2020

J. M. Zuo
J. M. Zuo*
Affiliation:
Dept. of Physics and Astronomy, Arizona State University, Tempe, AZ85287
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In the annual dark field (ADF) imaging mode, diffraction intensities inside the ADF detector cutoff angle are discarded. This results a significant loss of the available information. By simultaneous recording the diffraction patterns, we can gain additional information about the specimen, while the ADF image gives the precise position of the probe. This paper describes how to extract the local lattice parameters or to measure the strain field from the zero diffraction disk. The accurate measurement of strain field close to an interface provide the complementary information about the composition and the structure of the interface. An example is the oxygen deficiency in high Tc superconductor of YBa2Cu3O7-δ. The level of oxygen deficiency is too small to be detected by x-ray spectroscopy but affect the lattice parameters significantly that can be experimentally measured [1].

Type
The Theory and Practice of Scanning Transmission Electron Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 132 - 133
Copyright
Copyright © Microscopy Society of America

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References

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