Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-28T02:28:51.891Z Has data issue: false hasContentIssue false
  • English
  • Français

Cryogenic Microcalorimeters for High Resolution Energy Dispersive X-Ray Spectrometry

Published online by Cambridge University Press:  02 July 2020

J.Höhne ,
M. Altmann ,
G. Angloher ,
M. Bühler ,
F.v. Feilitzsch ,
T. Frank ,
P. Hettl ,
T. Hertrich ,
J. Jochum  and
T. Nüßle
...Show all authors
J.Höhne
Affiliation:
CSP Cryogenic Spectrometers GmbH, Bahnhofstr. 18a, D-85737 Ismaning, Germany
M. Altmann
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
G. Angloher
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
M. Bühler
Affiliation:
CSP Cryogenic Spectrometers GmbH, Bahnhofstr. 18a, D-85737 Ismaning, Germany
F.v. Feilitzsch
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
T. Frank
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
P. Hettl
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
T. Hertrich
Affiliation:
CSP Cryogenic Spectrometers GmbH, Bahnhofstr. 18a, D-85737 Ismaning, Germany
J. Jochum
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
T. Nüßle
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
S. Pfnür
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
J. Schnagl
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
S. Wänninger
Affiliation:
Technische Universität München, Physik Department El 5, D-85748, Garching, Germany
Get access

Extract

Abstract

Cryogenic detectors with excellent energy resolution and low energy threshold far beyond the level of semiconducting detectors open a variety of new. applications in physics including search for Dark Matter in the universe [2], neutrino physics [3], and IR-, UV- and X-ray astrophysics [4, 9]. Interdisciplinary fields where cryogenic detectors have already shown promising results are the detection of biomolecules [5] and X-ray spectroscopy at synchrotron beam lines [6] and in scanning electron microscopes (SEMs) [7]. For both, astrophysical and analytical use, the development of high resolution microcalorimeters based on iridium/gold phase transition thermometers and aluminum tunnel junctions for use in a compact and universal detector system was initiated.

Our cryogenic microcalorimeters consist of an absorber, a temperature sensor and a weak coupling to a heat sink. An X-ray photon interacts with the absorber and raises its temperature. The sensor measures the temperature increase and the system then, mediated by the coupling, relaxes back to its operating temperature.

Type
Mas Celebrates: Fifty Years of Electron Probe Microanalysis
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 604 - 605
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Proceedings of 7th Workshop on Low Temperature Detectors (LTD7), pub. by MPI for Physics, Munich, ISBN 3-00-002 266-X, 1997Google Scholar
[2]Nam, S.W.et.al in [1], 217 Hote, D.L'et.al in[l], 237 Sisti, M., Proc. in [1], 232Google Scholar
[3]Altmann, M.et.al Proc. of 4th Solar Neutrino Conference, Heidelberg, 1997 Höhne, J.et.al in [1], 184Google Scholar
[4] P. Hettl et.al in [l],20 Deiker, S.et.al in [1], 108 Verhoeve, P.et.al accepted for publication in Appl. Phys. Lett., June 1998Google Scholar
[5]Labov, S.et.al in [1], 82 Gerbier, D.et.al in [1], 73 Hilton, G.et.alNature 391 (1998) 672–675Google Scholar
[6]Frank, M.et.alRev. Sci. Instr. 69 (1) 1998 Labov, S.et.al in [1], 82CrossRefGoogle Scholar
[7]Wollman, D.et.al to be published in Characterization and Metrology for ULSI Technology (1998) Wollman, D.et.alJ. Microscopy 188 (3) (1997) 196–223Silver, E.et.al X-Ray Spectr. 26 (1997)CrossRefGoogle Scholar
[8]Höhne, J.et.al Proceedings of EDXRS 98, Bologna, 7-12 June, 1998Google Scholar
[9]Hettl, P.et.al Proceedings of EDXRS 98, Bologna, 7-12 June, 1998Google Scholar