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Correlation between Charge Contrast Imaging and the Distribution of Some Trace Level Impurities in Gibbsite

Published online by Cambridge University Press:  08 August 2002

Travis C. Baroni ,
Brendan J. Griffin ,
James R. Browne  and
Frank J. Lincoln
Travis C. Baroni*
Affiliation:
Department of Chemistry, The University of Western Australia, Nedlands
Brendan J. Griffin
Affiliation:
Centre for Microscopy and Microanalysis, The University of Western Australia, Nedlands
James R. Browne
Affiliation:
Centre for Microscopy and Microanalysis, The University of Western Australia, Nedlands
Frank J. Lincoln
Affiliation:
Department of Chemistry, The University of Western Australia, Nedlands
*
Department of Chemistry, The University of Western Australia, Nedlands, Perth, Western Australia 6097, Australia
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Abstract

Charge contrast images (CCI) of synthetic gibbsite obtained on an environmental scanning electron microscope gives information on the crystallization process. Furthermore, X-ray mapping of the same grains shows that impurities are localized during the initial stages of growth and that the resulting composition images have features similar to these observed in CCI. This suggests a possible correlation between impurity distributions and the emission detected during CCI. X-ray line profiles, simulating the spatial distribution of impurities derived from the Monte Carlo program CASINO, have been compared with experimental line profiles and give an estimate of the localization. The model suggests that a main impurity, Ca, is depleted from the solution within approximately 3–4 μm of growth.

Keywords

environmental scanning electron microscopecharge contrast imaginggibbsitewavelength dispersive spectrometry-X-ray mappingMonte Carlo simulations
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 1 , January 2000 , pp. 49 - 58
Copyright
Copyright © Microscopy Society of America 2000

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