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Considerations for Three Dimensional Imaging In the Crossbeam FIB

Published online by Cambridge University Press:  01 August 2004

Eric Lifshin ,
Edward L. Principe ,
James Evertsen ,
Art Dewey ,
Peter Gnauck  and
John Friel
Eric Lifshin
Affiliation:
University at Albany, New York
Edward L. Principe
Affiliation:
LEO Electron Microscopy, Redwood City, California
James Evertsen
Affiliation:
University at Albany, New York
Art Dewey
Affiliation:
LEO Electron Microscopy, Redwood City, California
Peter Gnauck
Affiliation:
LEO Electron Microscopy, Redwood City, California
John Friel
Affiliation:
Princeton Gamma-Tech, Princeton, New Jersey
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1134 - 1135
Copyright
© 2004 Microscopy Society of America

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