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Compression of Secondary Ion Microscopy Image Sets Using a Three-dimensional Wavelet Transformation

Published online by Cambridge University Press:  08 August 2002

Martin G. Wolkenstein  and
Herbert Hutter
Martin G. Wolkenstein
Affiliation:
Vienna University of Technology, Vienna
Herbert Hutter*
Affiliation:
Vienna University of Technology, Vienna
*
Institute of Analytical Chemistry, Vienna University of Technology, Getreidemarkt 9/151, 1060 Vienna, Austria
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Abstract

This article proposes a lossy three-dimensional (3-D) image compression method for 3-D secondary ion microscopy (SIMS) image sets that uses a separable nonuniform 3-D wavelet transform. A typical 3-D SIMS measurement produces relatively large amounts of data which has to be reduced for archivation purposes. Although it is possible to compress an image set slice by slice, more efficient compression can be achieved by exploring the correlation between slices. Compared to different two-dimensional (2-D) image compression methods, compression ratios of the 3-D wavelet method are about four times higher at a comparable peak signal-to-noise ratio (PSNR).

Keywords

waveletsthree-dimensional secondary ion microscopycompression
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 1 , January 2000 , pp. 68 - 75
Copyright
Copyright © Microscopy Society of America 2000

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