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Compositional Mapping by X-ray Spectrum Imaging at 1 MHz Output Count Rate with the Silicon Drift Detector

Published online by Cambridge University Press:  03 August 2008

D Newbury ,
J Davis ,
D Bright ,
N Ritchie ,
J Michael  and
P Kotula
D Newbury
Affiliation:
National Institute of Standards and Technology
J Davis
Affiliation:
National Institute of Standards and Technology
D Bright
Affiliation:
National Institute of Standards and Technology
N Ritchie
Affiliation:
National Institute of Standards and Technology
J Michael
Affiliation:
Sandia National Laboratory
P Kotula
Affiliation:
Sandia National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1164 - 1165
Copyright
© 2008 Microscopy Society of America

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