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Compositional change of NaCl particles under electron beam irradiation measured by time-resolved X-ray analysis

Published online by Cambridge University Press:  23 November 2012

I. Ohnishi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
K. Shibuya
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
K. Tachibana
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
J. Yamagata
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
M. Morita
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
T. Watanabe
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
S. Miyazawa
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
H. Takahashi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Y. Ohkura
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Y. Kondo
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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