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Closed-Cell Foam Skin Thickness Measurement Using a Scanning Electron Microscope

Published online by Cambridge University Press:  08 September 2011

Clifford S. Todd  and
Valentina Kuznetsova
Clifford S. Todd*
Affiliation:
The Dow Chemical Company, Analytical Sciences, Midland, MI 48667, USA
Valentina Kuznetsova
Affiliation:
The Dow Chemical Company, Dow Building Solutions. Midland, MI 48674, USA
*
Corresponding author. E-mail: [email protected]
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Abstract

Closed cell polymer foam skin thickness can be assessed by taking backscatter electron (BSE) images in a scanning electron microscope (SEM) at a series of accelerating voltages. Under a given set of experimental conditions, the electron beam mostly passes through thin polymer skin cell walls. That cell appears dark compared to adjacent thicker-skinned cells. Higher accelerating voltages lead to a thicker skin being penetrated. Monte Carlo modeling of beam-sample interactions indicates that at 5 keV, skin less than ∼0.5 μm in thickness will appear dark, whereas imaging at 30 keV allows skin thicknesses up to ∼4 μm to be identified. The distribution of skin thickness can be assessed over square millimeters of foam surface in this manner. Qualitative comparisons of the skin thicknesses of samples can be made with a simple visual inspection of the images. A semiquantitative comparison is possible by applying image analysis. The proposed method is applied to two example foams. Characterizing foam skin thickness by this method is possible using any SEM that is capable of collecting useful BSE images over a range of accelerating voltages. Imaging in low vacuum, where an electrically conductive metal coating is not required, leads to more sensitivity in skin thickness characterization.

Keywords

SEMpolymerfoamskin thicknessbackscatter electrons
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 5 , October 2011 , pp. 772 - 778
Copyright
Copyright © Microscopy Society of America 2011

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References

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