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Chemical Microcharacterization of Ultrathin Iodide Conversion Layers and Adsorbed Thiocyanate Surface Layers on Silver Halide Microcrystals with Time-of-Flight SIMS

Published online by Cambridge University Press:  30 July 2002

Geert Verlinden ,
Renaat Gijbels  and
Ingrid Geuens
Geert Verlinden
Affiliation:
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
Renaat Gijbels
Affiliation:
Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610 Wilrijk, Belgium
Ingrid Geuens
Affiliation:
Agfa Gevaert N.V., Septestraat 27, B-2640 Mortsel, Belgium
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Abstract

The technique of imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) and dual beam depth profiling has been used to study the composition of the surface of tabular silver halide microcrystals. Analysis of individual microcrystals with a size well below 1 μm from a given emulsion is possible. The method is successfully applied for the characterization of silver halide microcrystals with subpercent global iodide concentrations confined in surface layers with a thickness below 5 nm. The developed TOF-SIMS analytical procedure is explicitly demonstrated for the molecular imaging of adsorbed thiocyanate layers (SCN) at crystal surfaces of individual crystals and for the differentiation of iodide conversion layers synthesized with KI and with AgI micrates (nanocrystals with a size between 10 and 50 nm). It can be concluded that TOF-SIMS as a microanalytical, surface-sensitive technique has some unique properties over other analytical techniques for the study of complex structured surface layers of silver halide microcrystals. This offers valuable information to support the synthesis of future photographic emulsions.

Keywords

dual beam depth profilingimagingparticle analysissilver halide microcrystalssurface analysisTOF-SIMS
Type
MICROANALYSIS
Information
Microscopy and Microanalysis , Volume 8 , Issue 3 , June 2002 , pp. 216 - 226
Copyright
2002 Microscopy Society of America

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