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Chemical and structural characterization with soft X-ray spectro-microscopies in correlation with electron and atomic force microscopies

Published online by Cambridge University Press:  23 November 2012

A. Hitchcock ,
B. Leung ,
J. Brash ,
E. Najafi ,
D. Rossouw  and
G. Botton
A. Hitchcock
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
B. Leung
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
J. Brash
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
E. Najafi
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
D. Rossouw
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
G. Botton
Affiliation:
BIMR, McMaster University, Hamilton, Ontario, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 846 - 847
Copyright
Copyright © Microscopy Society of America 2012

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