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Characterization of the Electrical Properties of Nickel-Based CMSX-4 Super-alloys Using Atomic Force Microscopy (AFM)

Published online by Cambridge University Press:  01 August 2004

Guangchun Cui  and
Rosario A Gerhardt
Guangchun Cui
Affiliation:
Georgia Institute of Technology
Rosario A Gerhardt
Affiliation:
Georgia Institute of Technology
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1102 - 1103
Copyright
© 2004 Microscopy Society of America

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