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Characterization of Carbon Nanomaterials with a confocal Raman-AFM

Published online by Cambridge University Press:  23 November 2012

U. Schmidt ,
T. Dieing ,
K. Weishaupt ,
W. Liu  and
J. Yang
U. Schmidt
Affiliation:
WITec GmbH, Ulm, Germany
T. Dieing
Affiliation:
WITec GmbH, Ulm, Germany
K. Weishaupt
Affiliation:
WITec GmbH, Ulm, Germany
W. Liu
Affiliation:
WITec Instruments Corp, Maryville, TN
J. Yang
Affiliation:
WITec Instruments Corp, Maryville, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1504 - 1505
Copyright
Copyright © Microscopy Society of America 2012

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