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Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM

Published online by Cambridge University Press:  23 November 2012

M. Terauchi
Affiliation:
IMRAM, Tohoku Univ., Sendai, Japan
H. Takahashi
Affiliation:
JEOL Ltd., Tokyo, Japan
N. Handa
Affiliation:
JEOL Ltd., Tokyo, Japan
T. Murano
Affiliation:
JEOL Ltd., Tokyo, Japan
M. Koike
Affiliation:
QBSD JAEA, Kyoto, Japan
T. Kawachi
Affiliation:
QBSD JAEA, Kyoto, Japan
T. Imazono
Affiliation:
QBSD JAEA, Kyoto, Japan
N. Hasegawa
Affiliation:
QBSD JAEA, Kyoto, Japan
M. Koeda
Affiliation:
Shimadzu Corp., Tokyo, Japan
T. Nagano
Affiliation:
Shimadzu Corp., Tokyo, Japan
H. Sasai
Affiliation:
Shimadzu Corp., Tokyo, Japan
Y. Oue
Affiliation:
Shimadzu Corp., Tokyo, Japan
Z. Yonezawa
Affiliation:
Shimadzu Corp., Tokyo, Japan
S. Kuramoto
Affiliation:
Shimadzu Corp., Tokyo, Japan
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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