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Breaking the 1% Accuracy Barrier in EPMA

Published online by Cambridge University Press:  23 November 2012

N.W. Ritchie
Affiliation:
NIST, Gaithersburg, MD
D.E. Newbury
Affiliation:
NIST, Gaithersburg, MD
S. Leigh
Affiliation:
NIST, Gaithersburg, MD
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2012

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