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Benefits of Aberration-corrected STEM and EELS in the Study of Nanoscale Materials for Energy and Photonic Applications

Published online by Cambridge University Press:  23 November 2012

F. Nan ,
S. Hosseini Vajargah ,
D. Rossouw ,
S.Y. Woo ,
M. Bugnet ,
M.C. Chan ,
N. Gauquelin ,
S. Stambula ,
G. Zhu  and
G. Botton
F. Nan
Affiliation:
McMaster University, Hamilton, Ontario, Canada
S. Hosseini Vajargah
Affiliation:
McMaster University, Hamilton, Ontario, Canada
D. Rossouw
Affiliation:
McMaster University, Hamilton, Ontario, Canada
S.Y. Woo
Affiliation:
McMaster University, Hamilton, Ontario, Canada
M. Bugnet
Affiliation:
McMaster University, Hamilton, Ontario, Canada
M.C. Chan
Affiliation:
McMaster University, Hamilton, Ontario, Canada
N. Gauquelin
Affiliation:
McMaster University, Hamilton, Ontario, Canada
S. Stambula
Affiliation:
McMaster University, Hamilton, Ontario, Canada
G. Zhu
Affiliation:
McMaster University, Hamilton, Ontario, Canada
G. Botton
Affiliation:
McMaster University, Hamilton, Ontario, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 336 - 337
Copyright
Copyright © Microscopy Society of America 2012

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