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Automation of Tilt Series Acquisition in Transmission Electron Microscopy for Applications in Biology and Materials Science

Published online by Cambridge University Press:  02 July 2020

Ingo Daberkow ,
Bernhard Feja ,
Peter Sparlinek  and
Hans R. Tietz
Ingo Daberkow
Affiliation:
Tietz Video and Image Processing Systems GmbH , D-82131 Gauting, Germany
Bernhard Feja
Affiliation:
Tietz Video and Image Processing Systems GmbH , D-82131 Gauting, Germany
Peter Sparlinek
Affiliation:
Tietz Video and Image Processing Systems GmbH , D-82131 Gauting, Germany
Hans R. Tietz
Affiliation:
Tietz Video and Image Processing Systems GmbH , D-82131 Gauting, Germany
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Abstract

During the last decade, computation of a three-dimensional image from a tilt series (3D reconstruction) has become a well established method, of which a variety of implementations are available. The term “electron tomography” is now generally used for this type of data acquisition and 3D reconstruction. An overview over the techniques involved is given in.

With the introduction of micro-processor-controlled TEMs and cooled slow-scan CCD cameras and with the progress in performance of high-speed computers, automation of complex imaging procedures became mainly a task of developing appropriate software, using the control facilities of the microscope. in this way, automated electron tomography was realized in 1990 at the Max- Planck-Institute for Biochemistry in Martinsried, and at about the same time at the University of California in San Francisco (UCSF). New techniques for automatic focusing and alignment, developed somewhat earlier , have been integrated in these automated tomography procedures. in the following we discuss the requirements of automatic data acquisition and the present implementation for several TEMs.

Type
Electron Tomography: Recent Advances and Applications (Organized by M. Marko)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 88 - 89
Copyright
Copyright © Microscopy Society of America 2001

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References

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