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Automatic Crystallographic Characterization in a Transmission Electron Microscope: Applications to Twinning Induced Plasticity Steels and Al Thin Films

Published online by Cambridge University Press:  03 May 2013

M. Galceran ,
A. Albou ,
K. Renard ,
M. Coulombier ,
P.J. Jacques  and
S. Godet
M. Galceran*
Affiliation:
4MAT (Materials Engineering, Characterization, Synthesis and Recycling), Université Libre de Bruxelles, Avenue F.D. Roosevelt 50, 1050 Brussels, Belgium CIC Energigune, Albert Einstein 48, 01510 Miñano (Álava), Spain
A. Albou
Affiliation:
Université catholique de Louvain, Institute of Mechanics, Materials and Civil Engineering, IMAP, Place Sainte Barbe 2, B-1348 Louvain-la-Neuve, Belgium
K. Renard
Affiliation:
Université catholique de Louvain, Institute of Mechanics, Materials and Civil Engineering, IMAP, Place Sainte Barbe 2, B-1348 Louvain-la-Neuve, Belgium
M. Coulombier
Affiliation:
Université catholique de Louvain, Institute of Mechanics, Materials and Civil Engineering, IMAP, Place Sainte Barbe 2, B-1348 Louvain-la-Neuve, Belgium
P.J. Jacques
Affiliation:
Université catholique de Louvain, Institute of Mechanics, Materials and Civil Engineering, IMAP, Place Sainte Barbe 2, B-1348 Louvain-la-Neuve, Belgium
S. Godet
Affiliation:
4MAT (Materials Engineering, Characterization, Synthesis and Recycling), Université Libre de Bruxelles, Avenue F.D. Roosevelt 50, 1050 Brussels, Belgium
*
*Corresponding author. E-mail: [email protected]
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Abstract

A new automated crystallographic orientation mapping tool in a transmission electron microscope technique, which is based on pattern matching between every acquired electron diffraction pattern and precalculated templates, has been used for the microstructural characterization of nondeformed and deformed aluminum thin films and twinning-induced plasticity steels. The increased spatial resolution and the use of electron diffraction patterns rather than Kikuchi lines make this tool very appropriate to characterize fine grained and deformed microstructures.

Keywords

twinningthin filmstransmission electron microscopyelectron diffractionorientation mapping
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 19 , Issue 3 , June 2013 , pp. 693 - 697
Copyright
Copyright © Microscopy Society of America 2013 

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