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Atomic-Scale Tomography: A 2020 Vision

Published online by Cambridge University Press:  13 May 2013

Thomas F. Kelly ,
Michael K. Miller ,
Krishna Rajan  and
Simon P. Ringer
Thomas F. Kelly*
Affiliation:
Cameca Instruments Inc., 5500 Nobel Drive, Suite 100, Madison, WI 53711, USA
Michael K. Miller
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA
Krishna Rajan
Affiliation:
Department of Materials Science and Engineering, Institute for Combinatorial Discovery, Iowa State University, 2220 Hoover Hall, Ames, IA 50011, USA
Simon P. Ringer
Affiliation:
School of Aerospace, Mechanical and Mechatronic Engineering, Australian Centre for Microscopy & Microanalysis, The University of Sydney, Sydney, NSW 2006, Australia
*
*Corresponding author. E-mail: [email protected] Editor's note: A short version of this article was published inMicroscopy Today, March 2012
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Abstract

Atomic-scale tomography (AST) is defined and its place in microscopy is considered. Arguments are made that AST, as defined, would be the ultimate microscopy. The available pathways for achieving AST are examined and we conclude that atom probe tomography (APT) may be a viable basis for AST on its own and that APT in conjunction with transmission electron microscopy is a likely path as well. Some possible configurations of instrumentation for achieving AST are described. The concept of metaimages is introduced where data from multiple techniques are melded to create synergies in a multidimensional data structure. When coupled with integrated computational materials engineering, structure–properties microscopy is envisioned. The implications of AST for science and technology are explored.

Keywords

atomic-scale tomographyatom probe microscopyatom probe tomographyintegrated computational materials engineering2020 Vision
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 19 , Issue 3 , June 2013 , pp. 652 - 664
Copyright
Copyright © Microscopy Society of America 2013 

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