Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Kelly, Thomas F.
2017.
The Many Connections Between Atom Probe and Electron Microscopy.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1032.
Zhang, Shilei
van der Laan, Gerrit
Müller, Jan
Heinen, Lukas
Garst, Markus
Bauer, Andreas
Berger, Helmuth
Pfleiderer, Christian
and
Hesjedal, Thorsten
2018.
Reciprocal space tomography of 3D skyrmion lattice order in a chiral magnet.
Proceedings of the National Academy of Sciences,
Vol. 115,
Issue. 25,
p.
6386.
Saxey, D.W.
Moser, D.E.
Piazolo, S.
Reddy, S.M.
and
Valley, J.W.
2018.
Atomic worlds: Current state and future of atom probe tomography in geoscience.
Scripta Materialia,
Vol. 148,
Issue. ,
p.
115.
Aruga, Yasuhiro
Kozuka, Masaya
and
Sato, Tatsuo
2018.
Formulation of initial artificial age-hardening response in an Al-Mg-Si alloy based on the cluster classification using a high-detection-efficiency atom probe.
Journal of Alloys and Compounds,
Vol. 739,
Issue. ,
p.
1115.
Eder, Katja
McCarroll, Ingrid
La Fontaine, Alexandre
and
Cairney, Julie M.
2018.
Nanoscale Analysis of Corrosion Products: A Review of the Application of Atom Probe and Complementary Microscopy Techniques.
JOM,
Vol. 70,
Issue. 9,
p.
1744.
Marceau, Ross K.W.
and
Dorin, Thomas
2018.
Fundamentals of Aluminium Metallurgy.
p.
1.
de Knoop, Ludvig
Juhani Kuisma, Mikael
Löfgren, Joakim
Lodewijks, Kristof
Thuvander, Mattias
Erhart, Paul
Dmitriev, Alexandre
and
Olsson, Eva
2018.
Electric-field-controlled reversible order-disorder switching of a metal tip surface.
Physical Review Materials,
Vol. 2,
Issue. 8,
Bender, Hugo
Bosch, Eric G T
Richard, Olivier
Mendez, David
Favia, Paola
and
Lazić, Ivan
2019.
3D characterization of nanowire devices with STEM based modes.
Semiconductor Science and Technology,
Vol. 34,
Issue. 11,
p.
114001.
Zheng, Fengshan
Migunov, Vadim
Caron, Jan
Du, Hongchu
Pozzi, Giulio
and
Dunin-Borkowski, Rafal E
2019.
Three-dimensional electric field mapping of an electrically biased atom probe needle using off-axis electron holography.
Microscopy and Microanalysis,
Vol. 25,
Issue. S2,
p.
326.
Wu, Mingjian
Tafel, Alexander
Hommelhoff, Peter
and
Spiecker, Erdmann
2019.
Determination of 3D electrostatic field at an electron nano-emitter.
Applied Physics Letters,
Vol. 114,
Issue. 1,
Kelly, Thomas F.
2019.
Springer Handbook of Microscopy.
p.
715.
Qiu, Shi
Garg, Vivek
Zhang, Shuo
Chen, Yu
Li, Jian
Taylor, Adam
Marceau, Ross K.W.
and
Fu, Jing
2020.
Graphene encapsulation enabled high-throughput atom probe tomography of liquid specimens.
Ultramicroscopy,
Vol. 216,
Issue. ,
p.
113036.
Reddy, Steven M.
Saxey, David W.
Rickard, William D. A.
Fougerouse, Denis
Montalvo, Stephanie D.
Verberne, Rick
and
van Riessen, Arie
2020.
Atom Probe Tomography: Development and Application to the Geosciences.
Geostandards and Geoanalytical Research,
Vol. 44,
Issue. 1,
p.
5.
2022.
Atomic-Scale Analytical Tomography.
p.
3.
2022.
Atomic-Scale Analytical Tomography.
p.
40.
2022.
Atomic-Scale Analytical Tomography.
p.
55.
Cojocaru-Mirédin, Oana
and
Devaraj, Arun
2022.
Correlative microscopy and techniques with atom probe tomography: Opportunities in materials science.
MRS Bulletin,
Vol. 47,
Issue. 7,
p.
680.
Kelly, Thomas F
Gorman, Brian P
and
Ringer, Simon P
2023.
Introduction to Atomic-Scale Tomography.
Microscopy and Microanalysis,
Vol. 29,
Issue. Supplement_1,
p.
589.
Mayer, Joachim
Barthel, Juri
Vayyala, Ashok
Dunin-Borkowski, Rafal
Bischoff, Maarten
van Leeuwen, Hugo
Kujawa, Stephan
Bunton, Joe
Lenz, Dan
and
Kelly, Thomas F
2023.
The TOMO Project – Integrating a Fully Functional Atom Probe in an Aberration-Corrected TEM.
Microscopy and Microanalysis,
Vol. 29,
Issue. Supplement_1,
p.
593.