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Atomic Structure Imaging Using an Aberration-Corrected Transmission Electron Microscope

Published online by Cambridge University Press:  05 September 2003

Markus Lentzen ,
Chun Lin Jia  and
Knut Urban
Markus Lentzen
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Chun Lin Jia
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Knut Urban
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 48 - 49
Copyright
Copyright © Microscopy Society of America 2003

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