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Atomic Scale Grain Boundary Faceting and Segregation in Hf Doped Al2O3 by Cs-corrected HAADF-STEM

Published online by Cambridge University Press:  23 November 2012

Z. Yu
Z. Yu*
Affiliation:
MSE, Lehigh University, Bethlehem, PA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America 2012

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