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Atomic resolution transmission imaging at 30keV via electron ptychography

Published online by Cambridge University Press:  23 November 2012

J.M. Rodenburg ,
A. Maiden ,
M. Humphry ,
B. Kraus  and
M. Sarahan
J.M. Rodenburg
Affiliation:
Electronic and Electrical Engineering, University of Sheffield, Sheffield, United Kingdom
A. Maiden
Affiliation:
Phase Focus Ltd, Sheffield, United Kingdom
M. Humphry
Affiliation:
Phase Focus Ltd, Sheffield, United Kingdom
B. Kraus
Affiliation:
Gatan Inc., Pleasanton, CA
M. Sarahan
Affiliation:
Gatan Inc., Pleasanton, CA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1024 - 1025
Copyright
Copyright © Microscopy Society of America 2012

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