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Atomic Force Scanning Electrochemical Microscopy (AFM-SECM) for Electrochemical Imaging at the Nanoscale

Published online by Cambridge University Press:  05 August 2007

J-S Moon ,
J Wiedemair ,
J-F Masson ,
B Mizaikoff  and
C Kranz
J-S Moon
Affiliation:
Georgia Institute of Technology
J Wiedemair
Affiliation:
Georgia Institute of Technology
J-F Masson
Affiliation:
Georgia Institute of Technology
B Mizaikoff
Affiliation:
Georgia Institute of Technology
C Kranz
Affiliation:
Georgia Institute of Technology
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 58 - 59
Copyright
© 2007 Microscopy Society of America

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