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Atomic Force Microscopy and Scanning Electron Microscopy Reveal Genome–dependent Ultrastructure of Seed Surface

Published online by Cambridge University Press:  02 February 2002

T. Guha ,
R. Bhar ,
V. Ganesan ,
A. Sen  and
R.L. Brahmachary
T. Guha*
Affiliation:
University Science Instrumentation Center, Electron Microscope Centre, University College of Science, University of Calcutta, 92 Acharya Prafulla Chandra Road, Calcutta 700 009, India
R. Bhar
Affiliation:
University Science Instrumentation Center, Jadavpur University, Calcutta 700 032, India
V. Ganesan
Affiliation:
Inter University Consortium, University of Indore, Khandwa Road, Indore 452017, India
A. Sen
Affiliation:
University Science Instrumentation Center, Electron Microscope Centre, University College of Science, University of Calcutta, 92 Acharya Prafulla Chandra Road, Calcutta 700 009, India
R.L. Brahmachary
Affiliation:
21B, Moti Jheel, Calcutta, 700 074 India
*
*Corresponding author
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Abstract

Both scanning electron microscopy (SEM) and contact mode imaging via atomic force microscopy (AFM) have been utilized to elucidate the ultrastructure of mung bean seed surfaces. The results indicate: 1) that AFM is useful in the examination of seed surface ultrastructure ex-vaccuo without the need for additional complex preparative procedures; and 2) that both the cotyledon and seed coat of different strains of mung beans bear specific ultrastructural details unique to each strain. To our knowledge, these are the first AFM images of seed surfaces.

Keywords

contact mode atomic force microscopyseed ultrastructuremung beangenomic imprintscanning electron microscopyimage of ⪙ 2 Å structuresnanomorphology
Type
Research Article
Information
Microscopy and Microanalysis , Volume 7 , Issue 6 , November 2001 , pp. 526 - 529
Copyright
Copyright © Microscopy Society of America 2001

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