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Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography

Published online by Cambridge University Press:  05 August 2007

R Hull ,
J Graham ,
A Kubis ,
A Portavoce  and
F Ross
R Hull
Affiliation:
University of Virginia
J Graham
Affiliation:
University of Virginia
A Kubis
Affiliation:
University of Virginia
A Portavoce
Affiliation:
CNRS
F Ross
Affiliation:
IBM Research
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 176 - 177
Copyright
© 2007 Microscopy Society of America

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