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Anisotropic Grain Boundary Segregation in Y-Doped TiO2

Published online by Cambridge University Press:  02 July 2020

G. D. Lian ,
A. Susalla  and
E. C. Dickey
G. D. Lian
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY, 40506
A. Susalla
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY, 40506
E. C. Dickey
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY, 40506
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Abstract

A variety of properties of polycrystalline TiO2, such as conductivity, creep and grain boundary diffusion, are strongly dependent on the atomic-level structure and chemistry of grain boundaries. TiO2 has been studied as a model dielectric system because of its relatively simple structure and well-understood point defect chemistry. Defect segregation in grain boundaries of polycrystalline and bi-crystal TiO2 have been studied by several groups and significant variations in solute segregation levels from boundary to boundary were observed. in this paper, we address this issue of anisotropic grain boundary segregation. We have measured solute segregation as a function of grain boundary misorientation to determine any correlation between segregation and misorientation.

Yttria-doped TiO2 polycrystalline samples were prepared by mixing 99.999% pure TiO2 powder with 0.1% mole percent 99.99% purity Y(NO3)3 (both powders are commercially available from Aldrich Co. or Alfa Co.), followed by uni-axial pressed to 200-400Pa and sintering at 1300 °C for about 5-7 hours.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 280 - 281
Copyright
Copyright © Microscopy Society of America 2001

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References

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